DIAGNOSIS OF THE PROFILE OF THE HEAVY-ION MICROBEAM AND ESTIMATION OFTHE AIMING ACCURACY OF THE SINGLE-ION-HIT WITH CASING CR-39

Authors
HAMANO T HIRAO T NASHIYAMA I SAKAI T KAMIYA T ISHII K TAKEBE M
Citation
T. Hamano et al., DIAGNOSIS OF THE PROFILE OF THE HEAVY-ION MICROBEAM AND ESTIMATION OFTHE AIMING ACCURACY OF THE SINGLE-ION-HIT WITH CASING CR-39, Radiation physics and chemistry (1993), 53(5), 1998, pp. 461-467
Citations number
18
Categorie Soggetti
Nuclear Sciences & Tecnology","Chemistry Physical","Physics, Atomic, Molecular & Chemical
Journal title
Radiation physics and chemistry (1993) → ACNP
ISSN journal
0969806X
Volume
53
Issue
5
Year of publication
1998
Pages
461 - 467
Database
ISI
SICI code
0969-806X(1998)53:5<461:DOTPOT>2.0.ZU;2-4
Abstract
The aiming accuracy of the single-ion-hit method has been studied by t he measurement of etch-pit patterns on a CR-39 film irradiated with a heavy-ion microbeam. It becomes clear that the aiming accuracy is dete rmined to be the size of the core-part of the microbeam, which is almo st twice as large as the full width at half maximum (FWHM) beam size m easured by the conventional secondary electron image method. (C) 1998 Elsevier Science Ltd. All rights reserved.