PHOTOELECTRIC PROPERTIES OF PB1-X-YSNXGEYTE - IN EPITAXIAL-FILMS

Citation
Vf. Chishko et al., PHOTOELECTRIC PROPERTIES OF PB1-X-YSNXGEYTE - IN EPITAXIAL-FILMS, Applied physics. A, Solids and surfaces, 57(6), 1993, pp. 567-572
Citations number
10
Categorie Soggetti
Physics, Applied
ISSN journal
07217250
Volume
57
Issue
6
Year of publication
1993
Pages
567 - 572
Database
ISI
SICI code
0721-7250(1993)57:6<567:PPOP-I>2.0.ZU;2-F
Abstract
Pb1-x-ySnxGeyTe:ln epitaxial films are examined in a wide temperature interval and at various background fluxes. These films have high sensi tivity to infrared radiation in the spectral range lambda < 20 mum. Th e lifetime depends exponentially on temperature and varies from severa l seconds at T = 10 K to 10(-2) s at T = 20 K. The two-electron model of Jahn-Teller centers is proposed to explain the results. Multielemen t photoresistors based on these films are fabricated and D = 1.7 x 10 (13) cm Hz1/2 W-1 at T = 25 K is achieved. Noise of the photoresistors is independent of background flux when it varies from 10(12) CM-2 s-1 to 10(18) CM-2 s-1. As compared with Si:Ga and Ge:Hg photoresistors, the responsitivity is several orders larger at the operating temperatu re 25-30K.