SPECTROELLIPSOMETRIC STUDY OF LEAD LANTHANUM ZIRCONATE-TITANATE AMORPHOUS FERROELECTRIC-LIKE THIN-FILMS

Lead lanthanum zirconate titanate (PLZT) amorphous thin films whose co mposition is stoichiometric 9/65/35 have been grown and they show some wonderful ferroelectric-like properties. The ellipsometric spectra of the PLZT ferroelectric-like amorphous films have been obtained by a h omemade automatic ellipsometer in the wavelength range of 200-700 nm, and their optical constant (refractive index n and extinction coeffici ent k) spectra have been determined. As the photon energy changes from 1.9 to 5.8 eV, the refractive index n of the PLZT amorphous films inc reases from 2.13 to 2.46, then decreases to 1.45. The absorption edge of the PLZT amorphous films is about 300 nm, while that of the transpa rent ceramics with the same composition is about 377 nm.