Vv. Matveev et al., ON THE MECHANISM OF POLYIMIDE SURFACE ROUGHENING DUE TO ANISOTROPIC ETCHING WITH A BEAM OF FAST OXYGEN-ATOMS, Chemical physics reports, 17(4), 1998, pp. 791-799
Analytical electron microscopy is employed to study the structure of i
ndividual elements of a ''fibrous'' relief formed on the surface of a
polyimide film (Capton N) etched with a beam of fast (2-4 eV) oxygen a
toms. At an integral flow of atoms equal to 10(20) atom/cm(2) the prot
rusions formed on the surface are shown to be mushroom-shaped. They co
nsist of a cylindrical ''stem'' 20-40 nm in diameter and 2 mu m high a
nd a ''hat'' 30-50 nm in diameter. It is inferred that the oval partic
les, ''hats'', at the protrusion top consist of amorphous diamond-like
carbon which is more resistant to impact of fast oxygen atoms than po
lyimide. Stem etching by oxygen atoms scattered in the fluffy fibrous
layer is supposed to eventually lead to liberation of the diamond-like
particles and their conversion into dust.