The thermal and chemical stabilities of Mo/Si multilayer structure use
d in Bragg-Fresnel optics were studied to get optimal technological pa
rameters of pattern generation. Mo/Si multilayers were annealed at tem
perature ranging from 360 to 770 K, treated with acetone and 5 parts p
er thousand NaOH solution, and characterized by small-angle x-ray diff
raction technique as well as x-ray photoelectron spectroscopy, and Oly
mpus microscopy.