Eh. Lee et al., RAMAN-SCATTERING FROM ION-IMPLANTED DIAMOND, GRAPHITE, AND POLYMERS, Physical review. B, Condensed matter, 48(21), 1993, pp. 15540-15551
Raman scattering studies were carried out to investigate the effects o
f ion implantation on the structure of diamond, graphite, and polymers
. Carbon phases produced by chemical vapor deposition (CVD diamond) an
d rf discharge (diamondlike carbon or DLC) were also analyzed. Two typ
es of amorphous carbon phases were distinguished with relevance to har
dness. In general, amorphous carbon phases produced by electron beam e
vaporation and sputtering are soft (hardness much less than 1 GPa), wh
ile DLC and some ion-beam-modified polymers are much harder. In all ca
ses, the characteristic Raman bands of the starting material were lost
upon ion implantation, and for the lowest fluences the one-phonon ban
ds near 1360 cm-1 (D line) and 1580 cm-1 (G line) of disordered polycr
ystalline graphite appeared. With increasing fluence these bands coale
sced into a broad, asymmetric peak with the D line shifting to higher
wave number and the G line shifting to lower wave number. This trend w
as clearly distinguishable from the finite crystallite size effect see
n in graphite, where, in addition to the appearance of the D line, the
G line shifts to higher wave number with decreasing crystallite sizes
. Raman scattering could not distinguish between soft and hard amorpho
us carbon. There was also no indication that the hardness of DLC films
and ion-beam-modified polymers was due to diamondlike sp3 bonds. Inst
ead, hardness in these materials is related to the three-dimensional i
nterconnectivity of chemical bonds. Experimental results suggest that
the amorphous carbons examined in this study are composed of random ne
tworks of distorted sp, sp2, and Sp3 bonded atoms, sometimes in a hydr
ogenated state. The hard carbons such as DLC films and ion beam modifi
ed polymers have long-range chemical connectivity while the soft carbo
ns such as damaged graphite, and carbon films prepared by sputter depo
sition lack such connectivity.