Tm. Aliev et Cs. Kim, MEASURING [V-TD V-UB] (=SIN-GAMMA/SIN-BETA WITHIN THE SM) THROUGH B-]M-NU(NU)OVER-BAR (M=PI, K, RHO, K-ASTERISK) DECAYS - ART-NO 013003/, Physical review. D. Particles and fields, 5801(1), 1998, pp. 3003
We propose a new method for the precise determination of [V-td/V-ub] f
rom the ratios of branching ratios B(B-->rho nu(nu)over-bar)/B(B-->rho
iota nu) and B(B-->pi nu(nu)over-bar)/B(B-->pi l nu). These ratios de
pend only on the ratio of the Cabibbo-Kobayashi-Maskawa (CKM) elements
[V-td/V-ub] with little theoretical uncertainty, when very small isos
pin breaking effects are neglected. As is well known, [V-td/V-ub] equa
ls (sin gamma/sin beta) for the CKM version of CP violation within the
standard model. We also give in detail analytical and numerical resul
ts on the differential decay width d Gamma(B-->Knu(nu)over-bar)/dq(2)
and the ratio of the differential rates dB(B-->rho (nu)over-bar)/dq(2
)/dB(B-->Knu(nu)over-bar)/dq(2) as well as B(B-->rho nu(nu)over-bar)/
B(B-->Knu(nu)over-bar) and B(B-->pi nu(nu)over-bar)/B(B-->K nu(nu)ove
r-bar). [S0556-2821(98)00513-X].