A SCALEABLE, STATISTICAL SPICE GUMMEL-POON MODEL FOR SIGE HBTS

A scaleable, statistical model has been developed for silicon germaniu m heterojunction transistors (SiGe HBT's), which are components of a c ommercially available BiCMOS technology for high-frequency application s. The SPICE Gummel-Poon (SGP) model parameters are scaled, and statis tics added, using language features built into HSPICE. DC and ac fit i s good over a wide range in emitter sizes, allotting an open-ended set of devices to be used,vith valid modeling capabilities. Features of I BM's HBT technology that contribute to the scaleability of the technol ogy are discussed.