XPS AND SXPS STUDIES ON IN-SITU PREPARED NA INSE INSERTION COMPOUNDS/

Authors
SCHELLENBERGER A SCHLAF R PETTENKOFER C JAEGERMANN W
Citation
A. Schellenberger et al., XPS AND SXPS STUDIES ON IN-SITU PREPARED NA INSE INSERTION COMPOUNDS/, Solid state ionics, 66(3-4), 1993, pp. 307-312
Citations number
39
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical
Journal title
Solid state ionics → ACNP
ISSN journal
01672738
Volume
66
Issue
3-4
Year of publication
1993
Pages
307 - 312
Database
ISI
SICI code
0167-2738(1993)66:3-4<307:XASSOI>2.0.ZU;2-1
Abstract
The interaction of UHV cleaved InSe crystals with Na deposited at room temperature has been investigated using X-ray and soft X-ray photoemi ssion. An insertion reaction is observed leading to an intercalation c ompound Na(x)InSe for small Na concentrations (x less-than-or-equal-to 0.1). A chemical reaction occurs with x > 0.1 generating Na2Se and me tallic In. The comparison of the XPS and the SXPS experiments clearly indicates the bulk character of this decomposition reaction.