QUANTITATIVE NONLINEAR DIELECTRIC MICROSCOPY OF PERIODICALLY POLARIZED FERROELECTRIC DOMAINS

Authors
GAO C DUEWER F LU YL XIANG XD
Citation
C. Gao et al., QUANTITATIVE NONLINEAR DIELECTRIC MICROSCOPY OF PERIODICALLY POLARIZED FERROELECTRIC DOMAINS, Applied physics letters, 73(8), 1998, pp. 1146-1148
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
73
Issue
8
Year of publication
1998
Pages
1146 - 1148
Database
ISI
SICI code
0003-6951(1998)73:8<1146:QNDMOP>2.0.ZU;2-7
Abstract
A nonlinear dielectric scanning tip microwave near-field microscope ca pable of submicron quantitative imaging of nonlinear dielectric consta nt was developed. This nondestructive technique was used to image the nonlinear dielectric constant profiles of an yttrium-doped LiNbO3 sing le crystal with periodically polarized ferroelectric domains. (C) 1998 American Institute of Physics. [S0003-6951(98)00634-2]