THE TRANSITION FROM THE D-STATE TO S-STATE DUE TO THERMAL FLUCTUATIONFOR HIGH-T-C, SUPERCONDUCTORS AS AN EVIDENCE FROM THE MICROWAVE PENETRATION-DEPTH MEASUREMENT
Lj. Chen et Jt. Lue, THE TRANSITION FROM THE D-STATE TO S-STATE DUE TO THERMAL FLUCTUATIONFOR HIGH-T-C, SUPERCONDUCTORS AS AN EVIDENCE FROM THE MICROWAVE PENETRATION-DEPTH MEASUREMENT, IEEE transactions on microwave theory and techniques, 46(9), 1998, pp. 1251-1256
A temperature dependence of the penetration depth lambda(T) measuremen
t for the high-T-c superconductors YBa2CU3O7 - delta and Tl2Ba2CaCu2O7
thin films elucidates a T-2 dependence at low temperatures and an exp
onential dependence at high temperatures. The transition temperature f
or the shift from T-2 to exponential dependence decreases as the durat
ion for the samples exposed to air increases. An impurity scattered me
chanism to fluctuate a pure d-wave to the s-wave by thermal fluctuaion
is proposed for the pairing states of these high-T-c superconducting
films.