THE TRANSITION FROM THE D-STATE TO S-STATE DUE TO THERMAL FLUCTUATIONFOR HIGH-T-C, SUPERCONDUCTORS AS AN EVIDENCE FROM THE MICROWAVE PENETRATION-DEPTH MEASUREMENT

Authors
Citation
Lj. Chen et Jt. Lue, THE TRANSITION FROM THE D-STATE TO S-STATE DUE TO THERMAL FLUCTUATIONFOR HIGH-T-C, SUPERCONDUCTORS AS AN EVIDENCE FROM THE MICROWAVE PENETRATION-DEPTH MEASUREMENT, IEEE transactions on microwave theory and techniques, 46(9), 1998, pp. 1251-1256
Citations number
39
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
46
Issue
9
Year of publication
1998
Pages
1251 - 1256
Database
ISI
SICI code
0018-9480(1998)46:9<1251:TTFTDT>2.0.ZU;2-W
Abstract
A temperature dependence of the penetration depth lambda(T) measuremen t for the high-T-c superconductors YBa2CU3O7 - delta and Tl2Ba2CaCu2O7 thin films elucidates a T-2 dependence at low temperatures and an exp onential dependence at high temperatures. The transition temperature f or the shift from T-2 to exponential dependence decreases as the durat ion for the samples exposed to air increases. An impurity scattered me chanism to fluctuate a pure d-wave to the s-wave by thermal fluctuaion is proposed for the pairing states of these high-T-c superconducting films.