ERROR ANALYSIS AND THERMAL-EXPANSION MEASUREMENT WITH ELECTRON-BEAM MOIRE

In this paper, the authors study errors incurred when using the experi mental technique of electron-beam moire. There are two sources of erro r: error manifested as an apparent magnification drift and error due t o fringe tracing. The error due to fringe tracing is nearly negligible in comparison to the error due to magnification drift. By investigati ng the thermal expansion of commercially pure copper, the authors demo nstrate the usefulness of the error estimate. The average result for t he coefficient of thermal expansion is within 1.8 percent of handbook values for this material, with a possible error due to apparent magnif ication drift of 9 percent.