2-DIMENSIONAL MODELING OF SIH4-H-2 RADIOFREQUENCY DISCHARGES FOR A-SI-H DEPOSITION

Citation
O. Leroy et al., 2-DIMENSIONAL MODELING OF SIH4-H-2 RADIOFREQUENCY DISCHARGES FOR A-SI-H DEPOSITION, Plasma sources science & technology, 7(3), 1998, pp. 348-358
Citations number
24
Categorie Soggetti
Phsycs, Fluid & Plasmas
ISSN journal
09630252
Volume
7
Issue
3
Year of publication
1998
Pages
348 - 358
Database
ISI
SICI code
0963-0252(1998)7:3<348:2MOSRD>2.0.ZU;2-V
Abstract
A two-dimensional numerical code, including three fluid modules to acc ount for the description of electrical, thermal and chemical phenomena , has been developed for the modelling of hydrogenated amorphous silic on deposition from SiH4-H-2 radio-frequency glow discharges in a cylin drical PECVD reactor. The results of the model are compared to experim ental data, obtained by different diagnostic techniques. The calculate d radical densities are compared to those measured by threshold ioniza tion mass spectrometry, at the centre of the substrate; the calculated SIH density profile between the electrodes is compared to those measu red by laser-induced fluorescence and the radial distribution of the d eposition rate on the substrate is compared to profilometry measuremen ts. Globally, the model correctly predicts the main discharge characte ristics for experimental conditions normally used for amorphous silico n deposition in the dust-free regime. The moderate agreement between m odel and experiment occurring for the hydrogen-dominated condition can be attributed to the simplified surface kinetics adopted in the model .