Ch. Yan et al., APPLICATION OF AM-241 EDXRF TO THE DETERMINATION OF RARE-EARTH SAMPLES OF SOLVENT-EXTRACTION PROCESSES, Journal of alloys and compounds, 277, 1998, pp. 940-943
A rapid energy dispersive X-ray fluorescence spectroscopy (EDXRF) anal
ysis system is established to determine rare earth concentrations. The
characteristic K-shell series X-rays of rare earths were excited by a
1.1x10(9) Bq Am-241 radioisotope source. The spectra were recorded an
d analyzed using a multi-channel analyzer, employing a high-purity Ge
detector. In this method, the Compton scattering peak, absorption of e
lements, and specific simplification are considered. Samples of light,
middle and heavy rare earths during separation processes in both hydr
ochloride solution and rare earth loaded organic phases were analyzed
off-line. Some comparative results measured by ICP are also given. The
results show that the method can be used for a wide range of rare ear
th concentrations (0.1-300 g l(-1) rare earth oxide). Being rapid, eff
ective, precise and non-destructive, the method can be applied to on-l
ine analysis to determine rare earth concentrations during separation
by solvent extraction. (C) 1998 Elsevier Science S.A.