Mh. Whangbo et al., DESCRIPTION OF PHASE IMAGING IN TAPPING MODE ATOMIC-FORCE MICROSCOPY BY HARMONIC APPROXIMATION, Surface science, 411(1-2), 1998, pp. 794-801
Tapping mode atomic force microscopy measurements were performed for a
n elastomer, polydimethylsiloxane, to obtain amplitudes and phase angl
es as a function of driving frequency at various driving and set-point
amplitudes. The amplitude curves support the harmonic approximation t
hat the vibrational characteristics of a tapping cantilever are essent
ially harmonic. Based on this approximation, we derived simple analyti
cal formulas describing the phase shift, the predictions of which agre
e reasonably well with experiment. Our work shows that the phase shift
is influenced by the dissipation energy as well as the resonance freq
uency shift associated with the tip-sample interaction, and suggests a
simple way of estimating the dissipation energy. (C) 1998 Elsevier Sc
ience B.V. All rights reserved.