DESCRIPTION OF PHASE IMAGING IN TAPPING MODE ATOMIC-FORCE MICROSCOPY BY HARMONIC APPROXIMATION

Citation
Mh. Whangbo et al., DESCRIPTION OF PHASE IMAGING IN TAPPING MODE ATOMIC-FORCE MICROSCOPY BY HARMONIC APPROXIMATION, Surface science, 411(1-2), 1998, pp. 794-801
Citations number
34
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
411
Issue
1-2
Year of publication
1998
Pages
794 - 801
Database
ISI
SICI code
0039-6028(1998)411:1-2<794:DOPIIT>2.0.ZU;2-P
Abstract
Tapping mode atomic force microscopy measurements were performed for a n elastomer, polydimethylsiloxane, to obtain amplitudes and phase angl es as a function of driving frequency at various driving and set-point amplitudes. The amplitude curves support the harmonic approximation t hat the vibrational characteristics of a tapping cantilever are essent ially harmonic. Based on this approximation, we derived simple analyti cal formulas describing the phase shift, the predictions of which agre e reasonably well with experiment. Our work shows that the phase shift is influenced by the dissipation energy as well as the resonance freq uency shift associated with the tip-sample interaction, and suggests a simple way of estimating the dissipation energy. (C) 1998 Elsevier Sc ience B.V. All rights reserved.