Iv. Akimova et al., DYNAMICS OF THE OPTICAL-DAMAGE OF OUTPUT MIRRORS OF RIDGE SEMICONDUCTOR-LASERS BASED ON STRAINED-QUANTUM-WELL HETEROSTRUCTURES, Quantum electronics, 28(7), 1998, pp. 629-632
An investigation of the dynamics of catastrophic optical damage of a l
aser diode facet showed that the characteristic energy-evolution time
of optical damage was 40-80 ns under pulsed operating conditions. When
the pulse duration was less than this characteristic time, the damage
was governed by the critical energy of a pulse. An estimate of the th
ickness of an overheated region gave less than 0.6 mu m.