Jt. Kindt et al., ELECTRON-HOLE PAIR CONTRIBUTIONS TO SCATTERING, STICKING, AND SURFACE-DIFFUSION - CO ON CU(100), The Journal of chemical physics, 109(9), 1998, pp. 3629-3636
To assess the importance of coupling to electron-hole pair (ehp) excit
ations for molecular sticking, scattering, and diffusion dynamics at m
etal surfaces, simulations of the CO/Cu(100) system were performed usi
ng the ''molecular dynamics with electronic frictions'' method. Over a
range of incident translational energies, energy losses to ehp excita
tions produce a moderate increase in sticking probability and account
for 5%-10% of initial translational energy in scattered molecules, sig
nificantly less than phonon losses. Vibrational excitation and deexcit
ation of scattered molecules, while remaining a minor pathway for ener
gy flow, is strongly affected by the inclusion of ehp excitations. Fin
ally, although equilibrium diffusion constants are unaffected by the i
nclusion of coupling to ehp, it causes a significant quenching of tran
sient mobility following adsorption of translationally hot molecules.
(C) 1998 American Institute of Physics.