ELECTRON-HOLE PAIR CONTRIBUTIONS TO SCATTERING, STICKING, AND SURFACE-DIFFUSION - CO ON CU(100)

Citation
Jt. Kindt et al., ELECTRON-HOLE PAIR CONTRIBUTIONS TO SCATTERING, STICKING, AND SURFACE-DIFFUSION - CO ON CU(100), The Journal of chemical physics, 109(9), 1998, pp. 3629-3636
Citations number
39
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
ISSN journal
00219606
Volume
109
Issue
9
Year of publication
1998
Pages
3629 - 3636
Database
ISI
SICI code
0021-9606(1998)109:9<3629:EPCTSS>2.0.ZU;2-D
Abstract
To assess the importance of coupling to electron-hole pair (ehp) excit ations for molecular sticking, scattering, and diffusion dynamics at m etal surfaces, simulations of the CO/Cu(100) system were performed usi ng the ''molecular dynamics with electronic frictions'' method. Over a range of incident translational energies, energy losses to ehp excita tions produce a moderate increase in sticking probability and account for 5%-10% of initial translational energy in scattered molecules, sig nificantly less than phonon losses. Vibrational excitation and deexcit ation of scattered molecules, while remaining a minor pathway for ener gy flow, is strongly affected by the inclusion of ehp excitations. Fin ally, although equilibrium diffusion constants are unaffected by the i nclusion of coupling to ehp, it causes a significant quenching of tran sient mobility following adsorption of translationally hot molecules. (C) 1998 American Institute of Physics.