ELECTRON-PARAMAGNETIC-RESONANCE AND ELECTRICAL-CONDUCTIVITY OF V2O5-ZNCL2-TEO2 GLASSES

Citation
S. Gupta et A. Mansingh, ELECTRON-PARAMAGNETIC-RESONANCE AND ELECTRICAL-CONDUCTIVITY OF V2O5-ZNCL2-TEO2 GLASSES, Philosophical magazine. B. Physics of condensed matter.Statistical mechanics, electronic, optical and magnetic, 78(3), 1998, pp. 265-277
Citations number
12
Categorie Soggetti
Physics, Applied",Mechanics,"Physics, Condensed Matter","Material Science
ISSN journal
13642812
Volume
78
Issue
3
Year of publication
1998
Pages
265 - 277
Database
ISI
SICI code
1364-2812(1998)78:3<265:EAEOV>2.0.ZU;2-5
Abstract
The electron paramagnetic resonance (EPR) spectra parameters g(paralle l to), g(perpendicular to), A(parallel to), A(perpendicular to), dc co nductivity, ac conductivity and dielectric constant of V2O5-ZnCl2-TeO2 glasses in the concentration range 50V(2)O(5)-XZnCl2-(50 - X)TeO2 (X = 0-45) and 40V(2)O(5)-XZnCl2-(60 - X)TeO2 (X = 0-50) are reported. It was observed that the addition of ZnCl2 initially decreases the V4+-t o-V5+ ratio, thereby giving well resolved EPR lines. The V4+-to-V5+ ra tio was found to decrease with increasing X up to 30; however, for hig her values of X > 30, electron spectroscopy for chemical analysis of t he samples indicate intercalation of ZnCl2 which results into an incre ase in the V4+-to-V5+ ratio. The value of the V4+-to-V5+ ratio for whi ch well resolved lines were found is 0.03 for 50V(2)O(5) and 0.04 for 40V(2)O(5) glasses. The dc and the ac conductivities as functions of X show a dip which coincides with minima in the V4+-to-V5+ ratio; howev er, the dielectric constant decreases continuously with increasing X. This indicates that the dominant contribution to the de and the ac con ductivities comes from hopping charge carriers, while its contribution to total dielectric polarization is small compared with ionic and ele ctronic polarization.