EVIDENCE FOR INPLANE ANTIFERROMAGNETIC DOMAINS IN ULTRATHIN NIO FILMS

Ultrathin films of NiO grown on Ag(100) were investigated by photoemis sion microscopy. To image antiferromagnetic domains, linearly polarize d light from an insertion device was used. The micrographs revealed la teral changes of the spectral line shapes of the 3p photoemission spec trum which were confirmed by taking full spectra with a lateral resolu tion of 150 nm (microspectroscopy). These changes indicate the presenc e of antiferromagnetic domains which can be distinguished because the magnetic moments (or components thereof) are either collinear or perpe ndicular to the electric field vector of the linearly polarized light.