MAGNETIZATION SWITCHING OF SUBMICROMETER CO DOTS INDUCED BY A MAGNETIC FORCE MICROSCOPE TIP

We have applied magnetic force microscopy (MFM) with an in situ electr omagnet to study the switching of the magnetization of submicrometer C o dots fabricated by means of electron-beam lithography. By using the MFM tip as a local-field source, the magnetization of individual singl e-domain Co dots could be reversed. Micromagnetic simulations show tha t the switching process is induced by the stray field of the MFM tip. Furthermore, the external field that is necessary to support switching of the dot depends on the tip-dot separation.