Microcalorimeters have been used to measure the temperature dependence
of the specific heat C-p(T) of amorphous RxFe100-x (R=Gd, Tb) thin fi
lms prepared by both sputtering and e-beam coevaporation. a-TbxFe100-x
films possess large randomly oriented local magnetic anisotropy and l
arge exchange coupling; they are considered random-anisotropy magnets.
By varying growth temperature and by annealing, films of the same com
position but with very different macroscopic anisotropy constant K-u w
ere prepared and studied. K-u reflects the degree of nonrandomness in
the local anisotropy axis directions. a-GdxFe100-x films possess negli
gible local and macroscopic anisotropy. All samples show a relatively
sharp peak in C-p(T) at the Curie temperature T-c determined by magnet
ization measurements, indicative of a phase transition, independent of
the magnitude of K-u. Effective critical exponents of alpha= alpha' =
- 0.6 to -0.7 and a critical amplitude ratio of 1.5-2.5 are measured
for reduced temperatures down to 0.02. Nearly all possible magnetic en
tropy is developed below T-c, unlike what is seen in spin glasses. Inc
reased growth or annealing temperature causes a small but systematic i
ncrease in T-c, in the inverse high-field susceptibility chi and in th
e homogeneity of the sample; K-u by contrast increases with growth tem
perature, but decreases with annealing.