EFFECT OF AN EXTERNAL ELECTRIC-FIELD ON DIFFUSION-CONTROLLED BULK ELECTRON-ION RECOMBINATION IN HIGH-MOBILITY SYSTEMS

The dependence of the rate constant of electron-ion recombination on t he external electric field in systems characterized by high electron m obility is calculated by means of computer simulation. Two simulation methods are proposed, applicable for high and low electric fields, res pectively. The rate constant is found to decrease with increasing elec tric field, the effect becomes stronger as the electron mean free time increases. Results obtained with the energy and the space criterion o f recombination are discussed and a comparison of the simulation resul ts with experimental data is included. (C) 1998 American Institute of Physics. [S0021-9606(98)51434-1].