EFFECT OF ANNEALING ON THE DIELECTRIC PERMITTIVITY OF STRONTIUM-TITANATE FILMS IN THE SRTIO3 AL2O3 STRUCTURE/

Citation
Am. Prudan et al., EFFECT OF ANNEALING ON THE DIELECTRIC PERMITTIVITY OF STRONTIUM-TITANATE FILMS IN THE SRTIO3 AL2O3 STRUCTURE/, Physics of the solid state, 40(8), 1998, pp. 1339-1343
Citations number
13
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637834
Volume
40
Issue
8
Year of publication
1998
Pages
1339 - 1343
Database
ISI
SICI code
1063-7834(1998)40:8<1339:EOAOTD>2.0.ZU;2-S
Abstract
The paper reports an experimental study of the structure of a strontiu m titanate film on. a sapphire substrate and of the dielectric propert ies of capacitors based on a SrTiO3/Pt/Al2O3 multilayer system before and after a high-temperature anneal. The macro- and microstructure of SrTiO3 films and its variation induced by the annealing have been inve stigated. The temperature and field dependences of the dielectric perm ittivity of strontium titanate films have been determined, and their c omparison with similar data for single crystals carried out. The mecha nisms by which annealing can affect the capacitor capacitance and the properties of SrTiO3 films are discussed. (C) 1998 American Institute of Physics. [S1063-7834(98)01608-6].