FABRICATION AND CHARACTERIZATION OF HIGH-QUALITY ORGANIC MULTIPLE-QUANTUM-WELL STRUCTURES

Citation
Hy. An et al., FABRICATION AND CHARACTERIZATION OF HIGH-QUALITY ORGANIC MULTIPLE-QUANTUM-WELL STRUCTURES, Thin solid films, 326(1-2), 1998, pp. 201-204
Citations number
7
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
326
Issue
1-2
Year of publication
1998
Pages
201 - 204
Database
ISI
SICI code
0040-6090(1998)326:1-2<201:FACOHO>2.0.ZU;2-G
Abstract
High quality organic multiple quantum well (MQW) structures consisting of alternating layers of tris(8-hydroxyquinoline) aluminum (Alq(3)) a nd iphenylyl)-5(4-tert-butyl-phenyl)-1,3,4-oxadiazole (PBD) have been prepared by a multisource-type high-vacuum organic molecular beam depo sition (OMBD) system which we have designed specially to improve the l arge-area uniformity and abrupt interfaces. Small angle X-ray diffract ion, optical absorption and photoluminescence measurement results indi cate that the MQW structures have a very uniform layered structure thr oughout the entire stack, and interfacial roughness is smaller than 1. 0 nm. Exciton energy shift to a high energy region with decreasing Alq 3 layer thickness has been observed. (C) 1998 Elsevier Science S.A. Al l rights reserved.