XPS STUDY OF NB-DOPED OXYGEN SENSING TIO2 THIN-FILMS PREPARED BY SOL-GEL METHOD

Citation
Mz. Atashbar et al., XPS STUDY OF NB-DOPED OXYGEN SENSING TIO2 THIN-FILMS PREPARED BY SOL-GEL METHOD, Thin solid films, 326(1-2), 1998, pp. 238-244
Citations number
15
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
326
Issue
1-2
Year of publication
1998
Pages
238 - 244
Database
ISI
SICI code
0040-6090(1998)326:1-2<238:XSONOS>2.0.ZU;2-B
Abstract
Titanium dioxide (TiO2) thin films have been prepared using the sol-ge l method and subsequently doped with niobium oxide (Nb2O5) for use in oxygen sensing applications. The chemical composition of the resultant film sensor surface has been investigated using X-ray pholoelectron s pectroscopy (XPS). Films are essentially stoichiometric with carbon as the dominant impurity at the surface. The film electrical resistance has been examined for detection of oxygen at concentrations of 1 ppm t o 1%. Doping resulted in a 40% increase in the oxygen gas sensitivity of the thin films at an operating temperature, as low as 190 degrees C . (C) 1998 Elsevier Science S.A. All rights reserved.