By measuring the dynamic response in PC type HgCdTe detectors, it was
found that at the operating temperature (77K), after laser irradiation
, the conductivity of detectors changes (showing memory), and responsi
bility is raised up. This effect will remain unchanged for a long term
at the operating temperature. When the temperature is raised to room
temperature, the memory function disappears. Various measurement resul
ts were given on this effect and its mechanism was analyzed in this pa
per.