NANOSCALE SEMICONDUCTOR INTERFACE CHARACTERIZATION BY PHOTO-STM (VOL 10, PG 619, 1998)

Authors
HIESGEN R MEISSNER D
Citation
R. Hiesgen et D. Meissner, NANOSCALE SEMICONDUCTOR INTERFACE CHARACTERIZATION BY PHOTO-STM (VOL 10, PG 619, 1998), Advanced materials, 10(12), 1998, pp. 899-899
Citations number
2
Categorie Soggetti
Material Science
Journal title
Advanced materials → ACNP
ISSN journal
09359648
Volume
10
Issue
12
Year of publication
1998
Pages
899 - 899
Database
ISI
SICI code
0935-9648(1998)10:12<899:NSICBP>2.0.ZU;2-D