CONTROL OF DEGRADATION PROCESSES IN ELECTRONIC DEVICES AND PREDICTIONOF THEIR RELIABILITY

Citation
Vk. Aladinskii et Ar. Kasimov, CONTROL OF DEGRADATION PROCESSES IN ELECTRONIC DEVICES AND PREDICTIONOF THEIR RELIABILITY, Measurement techniques, 41(1), 1998, pp. 61-64
Citations number
7
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
ISSN journal
05431972
Volume
41
Issue
1
Year of publication
1998
Pages
61 - 64
Database
ISI
SICI code
0543-1972(1998)41:1<61:CODPIE>2.0.ZU;2-R
Abstract
A method is proposed for controlling degradation processes and the rel iability of electronic devices with the aid of a system of informative parameters. Application of gamma radiation improves the sensitivity o f the method.