We have directly measured the solubility of iron in high and low boron
-doped silicon using instrumental neutron activation analysis. Iron so
lubilities were measured at 800, 900, 1000, and 1100 degrees C in sili
con doped with either 1.5 x 10(19) or 6.5 x 10(14) boron atoms/cm(3).
We have measured a greater iron solubility in high boron-doped silicon
as compared to low boron-doped silicon, however, the degree of enhanc
ement is lower than anticipated at temperatures >800 degrees C. The de
creased enhancement is explained by a shift in the iron donor energy l
evel towards the valence band at elevated temperatures. Based on this
data, we have calculated the position of the iron donor level in the s
ilicon band gap at elevated temperatures. We incorporate the iron ener
gy level shift in calculations of iron solubility in silicon over a wi
de range of temperatures and boron-doping levels, providing a means to
accurately predict iron segregation between high and low boron-doped
silicon. (C) 1998 American Institute of Physics. [S0003-6951(98)01936-
6].