STATIC CHARACTERIZATION OF N-MOS INVERTERS BETWEEN LIQUID-HELIUM AND ROOM TEMPERATURES

Citation
Im. Hafez et al., STATIC CHARACTERIZATION OF N-MOS INVERTERS BETWEEN LIQUID-HELIUM AND ROOM TEMPERATURES, Physica status solidi. a, Applied research, 138(1), 1993, pp. 343-348
Citations number
6
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
00318965
Volume
138
Issue
1
Year of publication
1993
Pages
343 - 348
Database
ISI
SICI code
0031-8965(1993)138:1<343:SCONIB>2.0.ZU;2-A
Abstract
DC characterization of n MOS inverters is carried out from liquid heli um up to room temperatures. The benefits resulting from the low temper ature operation on the performances of the n MOS inverter are studied. In particular, the improvement of the switching gain at low temperatu re is pointed out. Moreover, the relative noise margin is found to inc rease significantly at low temperature (almost-equal-to 50 K). The pos sibility to operate the n MOS inverter at low temperature while reduci ng the supply voltage and in turn the power consumption is emphasized.