Im. Hafez et al., STATIC CHARACTERIZATION OF N-MOS INVERTERS BETWEEN LIQUID-HELIUM AND ROOM TEMPERATURES, Physica status solidi. a, Applied research, 138(1), 1993, pp. 343-348
DC characterization of n MOS inverters is carried out from liquid heli
um up to room temperatures. The benefits resulting from the low temper
ature operation on the performances of the n MOS inverter are studied.
In particular, the improvement of the switching gain at low temperatu
re is pointed out. Moreover, the relative noise margin is found to inc
rease significantly at low temperature (almost-equal-to 50 K). The pos
sibility to operate the n MOS inverter at low temperature while reduci
ng the supply voltage and in turn the power consumption is emphasized.