NANOSCALE PHOTOCURRENT VARIATIONS AT METAL-MODIFIED SEMICONDUCTOR SURFACES

Citation
R. Hiesgen et D. Meissner, NANOSCALE PHOTOCURRENT VARIATIONS AT METAL-MODIFIED SEMICONDUCTOR SURFACES, JOURNAL OF PHYSICAL CHEMISTRY B, 102(34), 1998, pp. 6549-6557
Citations number
24
Categorie Soggetti
Chemistry Physical
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
102
Issue
34
Year of publication
1998
Pages
6549 - 6557
Database
ISI
SICI code
1089-5647(1998)102:34<6549:NPVAMS>2.0.ZU;2-E
Abstract
The photocurrents measured by a scanning tunneling microscope have bee n used to analyze the electronic properties of nanoscale-modified WSe2 semiconductor surfaces. On uncovered crystals in ambient air, space c harges along steps can be analyzed. On copper-modified semiconductor s urfaces, the space charge zones around pulse-deposited metal particles and their dependence on the size of the metal particle can be determi ned and provide a first direct proof of size-dependent barrier heights of nanosized Schottky contacts. Also, the time evolution of the elect ronic properties of a metal-modified WSe2 surface under corrosion cond itions was followed by photocurrent measurements. By combination of ph otocurrent measurements and local current/voltage curves, the influenc e of recombination and of charges on the photocurrent can be separated .