KINETICS OF ELECTRON CHARGING AND DISCHARGING ON EMBEDDED W-DISKS IN GAAS

Citation
Le. Wernersson et al., KINETICS OF ELECTRON CHARGING AND DISCHARGING ON EMBEDDED W-DISKS IN GAAS, Physical review. B, Condensed matter, 58(8), 1998, pp. 4207-4210
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
58
Issue
8
Year of publication
1998
Pages
4207 - 4210
Database
ISI
SICI code
0163-1829(1998)58:8<4207:KOECAD>2.0.ZU;2-8
Abstract
Electron-capture and -emission processes in nanometer-sized Schottky c ontacts on a floating potential have been studied experimentally. Arra nged patterns of tungsten disks have been embedded in GaAs by epitaxia l overgrowth and a buried semi-insulating layer is created by overlapp ing depletion regions from the individual disks. We have investigated the embedded metal-semiconductor contacts by space-charge techniques. We demonstrate how these buried contacts can be characterized opticall y and electrically, and that the metal disks may be charged and discha rged in a controlled way. The data reveal the difference between singl e- and multiple-electron processes.