OBSERVATION OF THE REVERSIBLE H-INDUCED STRUCTURAL TRANSITION IN THINY-FILMS VIA X-RAY PHOTOELECTRON DIFFRACTION

Citation
J. Hayoz et al., OBSERVATION OF THE REVERSIBLE H-INDUCED STRUCTURAL TRANSITION IN THINY-FILMS VIA X-RAY PHOTOELECTRON DIFFRACTION, Physical review. B, Condensed matter, 58(8), 1998, pp. 4270-4273
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
58
Issue
8
Year of publication
1998
Pages
4270 - 4273
Database
ISI
SICI code
0163-1829(1998)58:8<4270:OOTRHS>2.0.ZU;2-Q
Abstract
Yttrium can be loaded with hydrogen up to high concentrations causing dramatic structural and electronic changes of the host lattice. We rep ort on the reversibility of hydrogen loading in thin single-crystallin e Y films grown by vapor deposition on W(110). Under a H-2 partial pre ssure of 1x10(-5) mbar the hexagonal-closed-packed Y films convert to the face-centered-cubic Y dihydride. Unloading is accomplished by anne aling the dihydride to 1000 K. No loss of crystallinity is observed du ring these martensitic transformations of the Y lattice. Moreover, we demonstrate a model to determine the H concentration in Y in situ.