X-RAY MAGNETIC LINEAR DICHROISM IN ABSORPTION AT THE L-EDGE OF METALLIC CO, FE, CR, AND V

It is demonstrated that x-ray magnetic linear dichroism (XMLD) in abso rption spectroscopy is a Viable technique for element-specific magneti c characterization of metallic thin films and multilayers. XMLD is mea sured at the Fe, Co, Cr, and V L-2,L-3 edges, and Varies from 1-11% of the edge jump in the absorption coefficient, with a magnitude that sc ales with the square of the magnetic moment. The XMLD spectra show sat isfactory agreement with first principles calculations of this effect.