V. Serin et al., EELS INVESTIGATION OF THE ELECTRON CONDUCTION-BAND STATES IN WURTZITEALN AND OXYGEN-DOPED ALN(O), Physical review. B, Condensed matter, 58(8), 1998, pp. 5106-5115
The electronic structures of pure and oxygen-doped AlN thin foils, gro
wn by the chemical-vapor-deposition technique, have been thoroughly in
vestigated using electron energy-loss measurements in a transmission e
lectron microscope. This technique offers the advantage of providing s
pectral data with a typical sub-1-eV energy resolution from well-chara
cterized areas. The interpretation of the experimentally determined el
ectron energy-loss near edge requires the detailed comparison with the
oretical calculations of unoccupied densities of states using self-con
sistent methods or from non-self-consistent multiple scattering calcul
ations.