WORST-CASE ESTIMATE OF MISMATCH INDUCED DISTORTION IN COMPLEMENTARY CMOS CURRENT MIRRORS

Authors
BRUUN E
Citation
E. Bruun, WORST-CASE ESTIMATE OF MISMATCH INDUCED DISTORTION IN COMPLEMENTARY CMOS CURRENT MIRRORS, Electronics Letters, 34(17), 1998, pp. 1625-1627
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
34
Issue
17
Year of publication
1998
Pages
1625 - 1627
Database
ISI
SICI code
0013-5194(1998)34:17<1625:WEOMID>2.0.ZU;2-2
Abstract
Mismatching between the MOS transistors in a current mirror causes har monic distortion. In a complementary class AB current mirror, mismatch ing of threshold voltages, geometries and transconductance parameters causes a distortion which cannot be eliminated by circuit techniques b ur which can be reduced by careful device matching. In this letter, th e author presents a worst case estimate of the harmonic distortion int roduced by device mismatch.