APPLICATION OF DIODE-LASERS TO DETERMINE EXCITATION TEMPERATURE IN HOLLOW-CATHODE DISCHARGES BY OPTOGALVANIC SPECTROSCOPY

Citation
Ec. Jung et al., APPLICATION OF DIODE-LASERS TO DETERMINE EXCITATION TEMPERATURE IN HOLLOW-CATHODE DISCHARGES BY OPTOGALVANIC SPECTROSCOPY, Spectroscopy letters, 31(6), 1998, pp. 1151-1165
Citations number
21
Categorie Soggetti
Spectroscopy
Journal title
ISSN journal
00387010
Volume
31
Issue
6
Year of publication
1998
Pages
1151 - 1165
Database
ISI
SICI code
0038-7010(1998)31:6<1151:AODTDE>2.0.ZU;2-6
Abstract
The excitation temperatures of sputtered gadolinium and uranium atoms in an argon hollow cathode discharge have been determined by diode las er-excited optogalvanic spectroscopy. These results have been compared to those determined by conventional emission spectroscopy. It was fou nd that the temperatures derived from each method do not differ very m uch, but the optogalvanic method revealed a better standard deviation uncertainty due to the good signal-to-background ratios and excellent spectral resolutions. Temperature variations with discharge currents r anging from 15 to 50 mA have been examined.