Ec. Jung et al., APPLICATION OF DIODE-LASERS TO DETERMINE EXCITATION TEMPERATURE IN HOLLOW-CATHODE DISCHARGES BY OPTOGALVANIC SPECTROSCOPY, Spectroscopy letters, 31(6), 1998, pp. 1151-1165
The excitation temperatures of sputtered gadolinium and uranium atoms
in an argon hollow cathode discharge have been determined by diode las
er-excited optogalvanic spectroscopy. These results have been compared
to those determined by conventional emission spectroscopy. It was fou
nd that the temperatures derived from each method do not differ very m
uch, but the optogalvanic method revealed a better standard deviation
uncertainty due to the good signal-to-background ratios and excellent
spectral resolutions. Temperature variations with discharge currents r
anging from 15 to 50 mA have been examined.