PROBLEMS OF THE HUMAN-BODY MODEL AND ELECTROSTATIC DISCHARGE PART 1 -DISCHARGE FROM LSIS HELD BY A CHARGED PERSON

Citation
K. Suzuki et al., PROBLEMS OF THE HUMAN-BODY MODEL AND ELECTROSTATIC DISCHARGE PART 1 -DISCHARGE FROM LSIS HELD BY A CHARGED PERSON, Semiconductor science and technology, 13(9), 1998, pp. 967-971
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
13
Issue
9
Year of publication
1998
Pages
967 - 971
Database
ISI
SICI code
0268-1242(1998)13:9<967:POTHMA>2.0.ZU;2-4
Abstract
The nanosecond transient response between a pin of a large-scale integ rated circuit (LSI) held by a charged person and the ground plane show ed a very sharp impulse and high peak current. This response could not be represented using the human body model (HBM), and it was caused by the parasitic capacity between an inner conductor in the LSI and the ground plane. However, the conventional HEM tester could not control t he low capacitance. Consequently, the machine model (MM) using a low c apacitance or the charged device model (CDM) with low device capacitan ce should be used. Moreover, the capacitanc of charged objects includi ng LSIs can be determined by a Coulomb meter. Practical use of these d ata will give us the methods to prevent electrostatic discharge troubl es for quarter-micron LSIs.