K. Suzuki et al., PROBLEMS OF THE HUMAN-BODY MODEL AND ELECTROSTATIC DISCHARGE PART 1 -DISCHARGE FROM LSIS HELD BY A CHARGED PERSON, Semiconductor science and technology, 13(9), 1998, pp. 967-971
The nanosecond transient response between a pin of a large-scale integ
rated circuit (LSI) held by a charged person and the ground plane show
ed a very sharp impulse and high peak current. This response could not
be represented using the human body model (HBM), and it was caused by
the parasitic capacity between an inner conductor in the LSI and the
ground plane. However, the conventional HEM tester could not control t
he low capacitance. Consequently, the machine model (MM) using a low c
apacitance or the charged device model (CDM) with low device capacitan
ce should be used. Moreover, the capacitanc of charged objects includi
ng LSIs can be determined by a Coulomb meter. Practical use of these d
ata will give us the methods to prevent electrostatic discharge troubl
es for quarter-micron LSIs.