USE OF COMPTON-SCATTERING MEASUREMENTS FOR ATTENUATION CORRECTIONS INRIETVELD PHASE-ANALYSIS WITH AN EXTERNAL STANDARD

Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectro metry. The method is mainly useful for Rietveld phase analysis when mi xing an internal standard is impossible or undesirable. The validity o f the method has been demonstrated using a suite of alumina-zirconia p owders of known composition. Also presented are results for a typical application-determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia- alumina ceramic composite. (C) 1998 International Centre for Diffract ion Data. [S0885-7156(98)00901-4]