The crystal structure of MoSi2 was investigated using a synchrotron X-
ray powder diffraction method. From the Rietveld analysis it was shown
that MoSi2 had a tetragonal structure of the space group I4/mmm and t
he lattice parameters were a = 032064(2) nm and c = 0.78478(8)nm. The
position of Si atoms in the 4e site was determined to be (0, 0, 0.3353
). There was a small shift in the z position, as compared to the previ
ously reported value, 0.3333. The electronic structure of MoSi2 was ca
lculated by the DV-X alpha molecular orbital method employing the refi
ned structural parameters, and this showed that there was a strong cov
alent bond between Si atoms aligned along the c axis in MoSi2. (C) 199
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