Wx. Ding et al., ENHANCED FORMATION OF NEGATIVE-IONS BY ELECTRON-ATTACHMENT TO HIGHLY EXCITED MOLECULES IN A FLOWING AFTERGLOW PLASMA, Journal of applied physics, 84(6), 1998, pp. 3051-3058
Preliminary evidence for efficient negative-ion formation using a plas
ma mixing scheme was reported in a recent letter [L. A. Pinnaduwage, W
. Ding, and D. L. McCorkle, Appl. Phys. Lett. 71, 3634 (1997)]. In the
present article we confirm the negative ion formation using a probe-a
ssisted photodetachment technique and estimate rate constants for elec
tron attachment to electronically excited CH4 and NO in a flowing afte
rglow plasma. It is shown that enhanced electron attachment to molecul
es in highly excited states populated via excitation transfer from rar
e gas metastables is responsible for the observed negative ion formati
on. Implications for plasma processing and plasma remediation discharg
es are also discussed. (C) 1998 American Institute of Physics.