Vi. Nikolaichik, SELF-DEVELOPING PROCESSES IN METAL FLUORIDES UNDER A FOCUSED ELECTRON-BEAM, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 68(2), 1993, pp. 227-236
The results of a study of self-developing processes in AlF3 and LiF fi
lms on thin carbon supports are presented. Rates of self-development a
nd simultaneous electron-energy-loss spectra were observed in the film
s of 25-500 nm thickness at current densities of 10(6)-10(8) A m-2 in
a scanning transmission electron microscope. Stages of the self-develo
pment are singled out and the processes taking place in these stages a
re discussed. Essential differences between AlF3 and LiF are pointed o
ut and a tentative scheme for the self-development is proposed.