QUANTITATIVE INTERFACE ROUGHNESS ANALYSIS OF FE CR SUPERLATTICES/

The quantitative characterization of the interface roughness of Fe/Cr superlattices is necessary for the understanding of the transport prop erties of such structures. This must include both vertical and lateral roughness components. The information can be obtained by specular and off-specular X-ray diffraction and conversion electron Mossbauer spec troscopy. We show how models describing specular and diffuse X-ray dif fraction can be applied to extract quantitative data. The robustness o f such data can be further enhanced using anomalous scattering, leadin g to an enhanced material contrast for Fe/Cr. Similarity and complemen tarity of the X-ray diffraction results with the Mossbauer data are di scussed. (C) 1998 Academic Press.