GRAIN-BOUNDARY SEGREGATION IN HIGH-PURITY, YTTRIA-STABILIZED TETRAGONAL ZIRCONIA POLYCRYSTALS (Y-TZP)

In this paper, we use high-resolution transmission electron microscopy and electron energy-loss spectroscopy to study the microstructure of grain boundaries and the segregation of yttrium, respectively, in yttr ia-stabilized tetragonal polycrystalline zirconia, sintered from diffe rent high-purity powders. No amorphous films were observed at the grai n boundaries, and only the sample containing the highest amount of sil icon impurity showed presence of an amorphous silicate phase in all tr iple grain junctions. A strong yrtrium segregation to the grain bounda ries is observed in all samples, despite different grain sizes and imp urity levels. (C) 1998 Elsevier Science Limited. All rights reserved.