Df. Thomas et al., SCANNING-TUNNELING-MICROSCOPY AND SPECTROSCOPY OF N-DOPED BATIO3 CERAMICS, Journal of the European Ceramic Society, 18(11), 1998, pp. 1637-1643
The methods of scanning tunnelling microscopy and spectroscopy have be
en applied to study the surface electronic properties of vacuum reduce
d n-doped BaTiO3 ceramics. These methods allow the acquisition of topo
graphical images of the surface of semi-conducting ceramics and at the
same time to collect the I-V tunnelling spectra at the points of inte
rest. Our results on polished BaTiO3 ceramics have shown the presence
of negative potential barriers at the ceramic's surface. Spontaneous p
olarization along with extrinsic surface states were considered as the
major reasons for the formation of surface potential barriers. Hyster
esis was observed in the I-V characteristics at 60% of the surface sit
es examined and this was attributed to the response time of the tunnel
ling current as a result of the charging and discharging kinetics of t
he extrinsic surface states (i.e. adsorbed oxygen or surface defects)
with a trap depth of up to 0.7 eV. (C) 1998 Elsevier Science Limited.
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