OPTIMAL DIAGNOSTIC EXAMINATION FOR LOCAL DIAGNOSIS

The paper deals with mesh-connected massively-parallel systems affecte d by failures. The complexity of a local diagnostic procedure, based o n new definitions of the local k-diagnosability and the r-fault-tolera nce, is analysed. It depends on distances between individual fault clu sters and on fault cluster diameters. In particular cases the minimum distance between fault clusters can be enlarged on the account of the maximum fault cluster diameter, e.g., by merging of two clusters. The criterion function for the optimal diagnostic examination for local di agnosis is proposed.