SURFACE WIDTH SCALING IN NOISE REDUCED EDEN CLUSTERS

Authors
BATCHELOR MT HENRY BI WATT SD
Citation
Mt. Batchelor et al., SURFACE WIDTH SCALING IN NOISE REDUCED EDEN CLUSTERS, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 58(3), 1998, pp. 4023-4026
Citations number
24
Categorie Soggetti
Physycs, Mathematical","Phsycs, Fluid & Plasmas
Journal title
Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics → ACNP
ISSN journal
1063651X
Volume
58
Issue
3
Year of publication
1998
Part
B
Pages
4023 - 4026
Database
ISI
SICI code
1063-651X(1998)58:3<4023:SWSINR>2.0.ZU;2-K
Abstract
The surface width scaling of Eden A clusters grown from a single aggre gate site on the square lattice is investigated as a function of the n oise reduction parameter. A two-exponent scaling ansatz is introduced and used to fit the results from simulations covering the range from f ully stochastic to the zero-noise limit.