Zx. Liu et al., PHOTOLUMINESCENCE AND REFLECTANCE STUDIES OF EXCITON-TRANSITIONS IN WURTZITE GAN UNDER PRESSURE, Physical review. B, Condensed matter, 58(11), 1998, pp. 6696-6699
We have measured photoluminescence (PL) and reflectance spectra of hig
h-quality wurtzite GaN on sapphire at pressures up to 8 Cpa (T=10 K).
All three intrinsic exciton transitions arising from the A, B, and C i
nterband transitions were observed in reflectance measurements. The PL
spectra are dominated by the A and B free exciton transitions and the
recombination of an exciton bound to a neutral donor. Transitions due
to the excited n=2 state of the A exciton and the first- and second-o
rder LO phonon replicas of the A free exciton were also resolved. The
pressure dependence of the A band gap and exciton binding energy is ob
tained from the intrinsic exciton energies. The experimental results c
learly reveal a sample-dependent change of the biaxial strain in the G
aN layers with increasing hydrostatic pressure.