Vv. Chaldyshev et al., EFFECT OF ISOVALENT INDIUM DOPING ON EXCESS ARSENIC IN GALLIUM-ARSENIDE GROWN BY MOLECULAR-BEAM EPITAXY AT LOW-TEMPERATURES, Semiconductors (Woodbury, N.Y.), 32(7), 1998, pp. 692-695
X-ray spectral microanalysis, optical transmission measurements at nea
r-infrared wavelengths, and x-ray diffractometry are used to show that
the isovalent indium doping of gallium arsenide during molecular-beam
epitaxy at low temperatures leads to an increase in the concentration
of excess arsenic trapped in the growing layer. (C) 1998 American Ins
titute of Physics.