Vp. Evtikhiev et al., GROWTH OF INAS QUANTUM DOTS ON VICINAL GAAS(001) SURFACES MISORIENTEDIN THE [010]DIRECTION, Semiconductors (Woodbury, N.Y.), 32(7), 1998, pp. 765-769
Atomic-force microscopy (AFM) is used to study InAs quantum-dot struct
ures grown by molecular-beam epitaxy (MBE) on vicinal GaAs(001) surfac
es misoriented in the [010] direction by 1, 2, 4, and 6 degrees. It is
shown for a chosen misorientation direction that a vicinal GaAs(010)
surface is covered with a network of stepped terraces. The thickening
of the network of terraces with increasing misorientation angle leads
to the suppression of adatom surface diffusion and makes it possible t
o achieve higher densities and more uniform ensembles of quantum dots,
while simultaneously decreasing the probability of their coalescence.
(C) 1998 American Institute of Physics.